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Ships within 48 hours · Estimated delivery Aug 11 - Aug 16
Transmission 74%
Material Code Copper C Nickel N Gold G Aluminum A Molybdenum M Titanium T Stainless Steel S
If repositioning is required
SCM cantilever holder for Dimension series SPMs DESCRIPTION
Triangular Test Grating for X- or Y-axis Select:Test grating TGT-1500, 3µm pitch, unmounted Transmission 74%DESCRIPTION The TGT 1500 test grating is intended for SPM calibration in X or Y axis, determination of lateral and vertical scanner nonlinearity, detection of angular distortion and tip characterization. Nominal values for height and pitch are given below. Actual values come with the test grating. Structure: Si wafer with grating in top surface Pattern type: 1 D array of triangular steps with precise linear and angular dimensions Edge angle:
